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Semiconductor Measureing Instruments of the Coper ElectronicsCoper Electronics - Products information
         (Semiconductor Measureing Instruments)

Measuring instrument of static characteristics for Power-Modules

Measuring instrument of static characteristics for Power-Modules
Measuring instrument of static characteristics for Power-Modules


► This is a static characteristic examination device in the power module.


■ Specifications

Object devicesN-Ch IGBT / IPM / MOS-FET Diode
The main measurement items IGES(+/-)
VGE(off)
ICES
VCES
VCE(SAT)
Others - The setting of the measurement condition is interactive to HOST PC.
- Measurement data is recorded by Comma Separated Value.
- Room temperature/high temperature measurement

★ This specification is one example. Please inquire details.

 


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