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Semiconductor Measureing Instruments of the Coper ElectronicsCoper Electronics - Products information
         (Semiconductor Measureing Instruments)

Dynamic characteristics Measureing Instruments for wafer-chip

Dynamic characteristics Measureing Instruments for wafer-chip
Dynamic characteristics Measureing Instruments for wafer-chip


► The dynamic response test in the chip unit became possible by a highly accurate positioning and the probing technology.


■ Specifications

Object devicesN-Ch IGBT / MOS-FET Diode
SW TIME VCC:1000V IC:1000A VG:+/-20V
VCE(SUS) VCC:1000V IC:2000A VG:+/-20V
VCE(SUS): 2500V
Load short-circuit VCC:1000V IC:5000A VG:+/-20V
Inductance L: 3uH - 1mH
Wave Acquisition D.S.O.
Others Palette supply and classification storage function

★ This specification is one example. Please inquire details.

 


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