Coper Electronics - Products information
         (Semiconductor tester / measuring instrument)

Semiconductor tester / measuring instrument

■ Information of the main product of the Coper Electronics, tester / measuring instruments of the static characteristic and the dynamic characteristic etc. of various semiconductors.

	Dynamic characteristic tester / measuring devices They are dynamic characteristic measureing instruments of various semiconductors (IGBT, IPM, FET, SiC, and Di, etc.).
	Static characteristic tester / measuring devices They are static characteristic measureing instruments of various semiconductors (IGBT, IPM, FET, SiC, Tr, and Di, etc.).
	Thermal resistance measuring instruments They are the thermal resistance measuring instruments of various semiconductors (IGBT, IPM, FET, SiC, Tr, and Di, etc.).
	Power cycle test equipments They are the power cycle test equipments of various semiconductors (IGBT, IPM, FET, SiC, Tr, and Di, etc.).
	Auto handler They are the Auto handlers of various semiconductors (IGBT, IPM, FET, SiC, Tr, and Di, etc.).

The above-mentioned product and the product described in a detailed page are one example of the product of our company. Please acknowledge limiting to a lot of other products by the secret maintenance contract with the customer in a general opening to the public.

Semiconductor measuring instrument section - Various correspondences

■ The following device and the measuring instrument corresponding to the measurement item are produced in the Coper Electronics.
   (Please consult about the device and the measurement items other than the following. )