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| Measuring instrument / tester of static characteristics for Wafer Chip |
► This is a static characteristic examination device in the chip unit.
■ Specifications
| Object devices | N-Ch IGBT / MOS-FET Diode |
| The main measurement items |
IGES(+/-) VGE(off) ICES VCES VCE(SAT) |
| Others |
- The setting of the measurement condition is interactive to HOST PC. - Measurement data is recorded by Comma Separated Value. - Room temperature/high temperature measurement |
★ This specification is one example. Please inquire details.
Coper Electronics - Products information